Measurements of the absolute spectral sensitivity of X-ray semiconductor detectors in the photon energy range of 1.5–15 keV using “white” SR beam of the VEPP-3 storage ring

Abstract

Results of measurements of the absolute spectral sensitivity of silicon semiconductor detectors in the X-ray quanta energy range of 1.5–15 keV are presented. The detectors, being calibrated, were placed into the direct “white” synchrotron radiation (SR) beam from the VEPP-3 storage ring. The spectrum of X-radiation at the entrance window of the detectors was changed by using sets of calibrated filters, as well as by varying the energy of the electrons in the storage ring. The possibility of accurate calculation of the SR spectrum on the calibrated detector under its irradiation in different conditions allowed us to determine the detector spectral sensitivity from a set of integral equations connecting the spectral sensitivity to the registered detector currents. The analysis of possible experimental errors indicates that the absolute spectral sensitivity of the detectors was restored with an accuracy of not worse than 10% in the total photon energy range under the study.