Abstract
Measurements have been made of the secondary electron emission due to primary electrons for graphite implanted with hydrogen and argon. Only hydrogen implantation affects the yields, increasing them with increasing dose and having a larger effect for lower energy of the implanted ions. The increase is typically 10–20%. The effect can be annealed by heating the samples to 600°C. It is concluded that the effect is due to hydrogen in the lattice rather than radiation damage. The results have been compared to a recent theoretical calculation. The order of magnitude of the increased yield is in reasonable agreement with experiment and the trends with angle are well reproduced. The trends with energy are not in such good agreement.
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