Measurements of Residual Stress in a Plate by X-Ray under the Consideration of Penetration Depth

Abstract

Considering a physical phenomenon of contribution of the internal stress in definite subsurface layer of metal to the X-ray diffraction, the authors derive a general fundamental formula existing between measured stress and internal stress. Then they propose the exact theories of residual stress measurement for the Front Surface Method and the Back Surface Method by successive thin layer removal in a plate, and show an example of application by characteristic X-rays of Cr and Co.