Abstract
A new diagnostic method capable of measuring beam profiles and trajectories of intense ion beams as a function of time has been developed. The technique employs fast photography in conjunction with fast scintillators. Prior to detection, the excessive intensity of the direct ion beam is reduced by means of Rutherford scattering. A time resolution of a few nanoseconds and a spatial resolution of a few millimeters has been achieved. Using this technique focusing properties of planar and spherical pinch reflex diodes have been investigated. A low energy electron beam precursor has been detected. A simple model for its production is presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
