Abstract
Scanning transmission electron microscopy (STEM) is a useful technique for the study of the morphology, composition, and electronic structure of quantum wells. However, most previous studies have been on epitaxially grown structures, before they had been used in devices. In this work we show that, with careful specimen preparation, advanced STEM techniques can be used to study a packaged commercially available light-emitting diode. The composition and morphology of both the quantum wells and the superlattices in this device have been determined and the electronic structure was measured with electron energy-loss spectroscopy.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
