Abstract
X-ray photoelectron spectroscopy was used to measure the energy discontinuity in the valence band (ΔEv) of Zn0.95Cd0.05O∕ZnO heterostructures grown by rf plasma-enhanced molecular-beam epitaxy. A value of ΔEv=0.17±0.03eV was obtained by using the Zn 2p energy level as a reference. Given the experimental band gap of 2.9 eV for the Zn0.95Cd0.05O, this would indicate a conduction band offset ΔEC of 0.30 eV in this system.
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