Abstract
Two techniques for the measurement of work function (WF) in a typical Auger electron spectrometer - the cylindrical mirror analyzer (CMA) - will be described and discussed. The first, utilizing shifts in the secondary electron emission threshold, has been more widely used by other workers. A means for computerization and discussion of the accuracy to be expected, as well as applications of this method to the adsorption of gases and metals on various substrates, will be given. Associated with this discussion will be observations on surface states and surface state spectroscopy. The second method for determining WF in a CMA is applicable in cases where a hot, electron emitting sample is to be studied; it does not appear to have been used in any previous studies. Results on WF variation with temperature from several dispenser cathodes will be used to illustrate this method which has the additional advantage over other thermionic emission measurements of not suffering from space charge limitations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
