Abstract
A procedure is developed to determine the twin wall and domain widths ofYBa2Cu3O7−δ samples through x-ray diffraction. Use is made of easily implemented simulations ofdiffraction spectra based on an existing model of the twin wall strain. It is shown thatwithin the range of typical values of the wall width, that is a few unit cells, the extractionof the domain width can be carried out independently of the wall strain profile considered.
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