Abstract
In this paper, a new measurement method for the total hemispherical emissivity of surfaces is introduced. A vacuum guarded hot plate apparatus is developed and it is employed for the emissivity measurement. Al, Ag, Au, and Ni coatings and STS 304 plate are used as the specimen. Measured total hemispherical emissivities are 0.05–0.24 with 8.1% uncertainty at most. This proves the reliability of current method even for highly reflective surfaces.
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