Abstract
AbstractA method is developed for measuring the thermal conductivity, thermal diffusivity, and specific heat of thin films and plates located on a thermally conductive base. The method of measurement involves the use of a point or line pulse heat source. Mathematical expressions for the present treatment are derived from the computed solution of the complex transcendental equations. The present method makes it possible to measure the temperature characteristics of samples of thickness h ≧ 10 μm located on a base with a practically arbitrary thermal conductivity and a definite temperature characteristic. However, the computation can easily be extended to include samples of thickness h < 10 μm.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
