Abstract
The effective thermal conductivities of SiN and TbFeCo thin films were measured by comparing the length and width of a polarizing microscope image of thermo-magnetically written domains with those of calculated isotherms for the trilayer structure of substrate/Si/sub 3/N/sub 4//Tb/sub 22/Fe/sub 70/Co/sub 8//Si/sub 3/N/sub 4/. The resulting data were applied to the quadrilayer structure of substrate/Si/sub 3/N/sub 4//Tb/sub 22/Fe/sub 70/Co/sub 8//Si/sub 3/N/sub 4//Al, and the length of the calculated isotherms turned out to agree with that of the written domain.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
