Measurement of thermal boundary resistance and thermal conductivity of single-crystalline Bi2Te3 nanoplate films by differential 3ω method

Abstract

We measured the thermal boundary resistance (TBR) and thermal conductivity of single-crystalline Bi2Te3 nanoplate films. The nanoplates were synthesized using the solvothermal method, and nanoplate films were formed using drop-casting followed by thermal annealing. The thermal resistance of nanoplate films of different thicknesses was measured by the application of a differential 3ω method. From the measured thermal resistance, the TBR was estimated to be 2.7 × 10−6 m2 K W−1. To negate the effect of TBR on the measured thermal resistance of the nanoplate films, we separately determined the thermal conductivity of the nanoplate film to be 1.57 ± 0.11 W m−1 K−1.