Abstract
Abstract A method for measuring the bulk absorption in optical single-layer films using both laser calorimetry and photoacoustic techniques is presented in this paper. The absorption and damage thresholds for evaporated dielectric single-layer films such as HfO 2 and ZnS were measured at wavelengths λ of 515 nm (530 nm) and 1060 nm respectively. When the laser power at the interfaces of the single-layer films vanishes, they do not contribute to the absorption. Therefore the absorption due to the bulk alone can be measured together with the thickness dependence of the related absorption data. A correlation between the absorption and damage thresholds was also found.
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