Abstract
We have developed a procedure to obtain the critical temperature for the amorphous-to-crystalline phase transition as well as the thermal conductivity and the specific heat of the phase-change media of optical recording. The procedure involves estimating the thermal conductivity from the data obtained by measuring the threshold cw laser power required for inducing phase transition. Then, from the data obtained in short-pulse measurements, we estimate the specific heat. In principle this method can yield the thermal parameters of any number of layers, so long as one of the layers is made of a phase-change material having a well-defined transition temperature.
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