Abstract
The solubility of germanium in thin (1000 to 6000A) aluminum films has been measured over the temperature range 120° to 390°C using the technique of MeV He+ backscattering. The results are in general agreement with previous measurements. The technique is described and its advantages and limitations for measurements of this type are discussed.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
