Abstract

The L X-ray intensity ratios (ILα/ILl, ILα/ILβ, ILα/ILγ) and the radiative L3-M vacancy transfer probabilities (ηL3-M) of some 4f elements such as Gd, Tb, Ho and compounds; Pr2O3, Pr2(CO3)3·8H2O, Nd2O3, Sm2O3, Sm2(CO3)3·2.85H2O, Sm2(SO4)3·8H2O, Gd2(CO3)3, Tb2O3, Dy2(SO4)3, Ho2O3 and HoF3 have been measured using Indus-2 synchrotron radiation. The elements and compounds are excited by synchrotron radiation and the emitted characteristic L X-ray photons are measured with high resolution silicon drift detector. The measured intensity ratios of compounds are not influenced by the chemical environment. However, the ηL3-M values of compound targets indicate the effect of crystal structure.

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