Measurement of the optical properties of a transparent, conductive carbon nanotube film using spectroscopic ellipsometry

Abstract

We have measured the complex refractive indices of a transparent, conductive carbon nanotube film by spectroscopic ellipsometry at wavelengths of 300–1700 nm (this includes the visible range). The film was produced on a quartz substrate by the doctor-blade method using single-walled carbon nanotube–polymer ink. The imaginary part of the complex refractive index of the film was found to be lower than 0.09 over the entire wavelength range. This film has a large advantage as a transparent, flexible, and conductive material.