Abstract
A measurement of the electron charge asymmetry in inclusive pp→W+X→eν+X production at s=7 TeV is presented based on data recorded by the CMS detector at the LHC and corresponding to an integrated luminosity of 840 pb−1. The electron charge asymmetry reflects the unequal production of W+ and W− bosons in pp collisions. The electron charge asymmetry is measured in bins of the absolute value of electron pseudorapidity in the range of |η|<2.4. The asymmetry rises from about 0.1 to 0.2 as a function of the pseudorapidity and is measured with a relative precision better than 7%. This measurement provides new stringent constraints for parton distribution functions.Received 12 June 2012DOI:https://doi.org/10.1103/PhysRevLett.109.111806This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.Published by the American Physical Society
Highlights
W the þ X ! e þ X production at Large Hadron Collider (LHC) and corresponding to an integrated luminosity of 840 pbÀ1
The electron charge asymmetry reflects the unequal production of Wþ and WÀ bosons in pp collisions
The electron charge asymmetry is measured in bins of the absolute value of electron pseudorapidity in the range of jj < 2:4
Summary
1:48 < jj < 3:00 in two end cap regions. A preshower detector consisting of two planes of silicon sensors interleaved with a total of 3X0 of lead is located in front of the ECAL end caps. The energy resolution measured for electrons from Z decays varies across the acceptance of the ECAL. It is less than 2% in the central region of the ECAL barrel (jj < 1), 3% in the outer barrel, and approximately 4%–5% in the end caps. The shape of the QCD background is determined, for each charge, from a signal-free control sample obtained by inverting a subset of the electron identification criteria [1]. The hatched area represents the statistical and systematic uncertainties associated with the fitting procedure Such as the Drell-Yan process, tt", and W !
Published Version (Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.