Abstract

We have performed the measurement of Casimir force between a spherical Au tip and an atomically flat Si(111)-(7 × 7) surface at tip–sample distances ranging from 15 to 50 nm in an ultrahigh vacuum of 1.5 × 10−8 Pa by frequency-modulation atomic force microscopy. Atomically flat Si(111) surfaces provided by the ultrahigh-vacuum condition and a degassed Au tip reduce the contact potential difference that must be compensated. These experimental conditions led to the elucidation of the distance dependence of the Casimir force down to the distance of 15 nm. The observed distance dependence still follows a theory provided by Chen et al. [Phys. Rev. A 74, 022103 (2006)] within these distances.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call