MEASUREMENT OF SURFACE ALPHA CONTAMINATION USING ELECTRET ION CHAMBERS

Abstract

Electret ion chambers (EICs) are known to be inexpensive, reliable, passive, integrating devices used for measurement of ionizing radiation. Their application for measurement of alpha contamination on surfaces was recently realized. This two-year project deals with the evaluation of electret ion chambers with different types of electrets and chambers for measurement of surface alpha contamination, their demonstration at U.S. Department of Energy (DOE) sites, a cost-benefit comparison with the existing methods, and the potential deployment at DOE sites. During the first year (FY98) of the project, evaluation of the EICS was completed. It was observed that EICS could be used for measurement of free release level of alpha contamination for transuranics (100 dpm/100 cm{sup 2} fixed). DOE sites, where demonstration of EIC technology for surface alpha contamination measurements could be performed, were also identified. During FY99, demonstration and deployment of EICS at DOE sites are planned. A cost-benefit analysis of the EIC for surface alpha contamination measurement will also be performed.