Measurement of PSF for the extended depth of field of microscope based on liquid lens

Abstract

To obtain the accurate integral PSF of an extended depth of field (EDOF) microscope based on liquid tunable lens and volumetric sampling (VS) method, a method based on statistic and inverse filtering using quantum dot fluorescence nanosphere as a point source is proposed in this paper. First, a number of raw quantum dot images were captured separately when the focus length of the liquid lens was fixed and changed over the exposure time. Second, the raw images were separately added and averaged to obtain two noise-free mean images. Third, the integral PSF was achieved by computing the inverse Fourier transform of the mean image's Fourier transform caught when the focus lens is fixed divided by that when the focus length is changed. Finally, experimental results show that restored image using the measured accumulated PSF has good image quality and no artifacts.