Abstract
AbstractMeasurement of phase noise using PLL is known as a highly precise method. But the method cannot be applied when the stability of the test oscillator is higher than that of the reference frequency.We propose a new measurement method based on the following idea: (1) make the signals which magnify phase noise in the test oscillator have higher stability by using a PLL, (2) include them in the VCXO's output and measure it.In this paper, we have clarified conditions to allow measurement over a wide frequency range and compare measured values with calculated values on phase noise of crystal oscillator. © 2001 Scripta Technica, Electron Comm Jpn Pt 2, 84(8): 64–70, 2001
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