Abstract
When a dielectric material is available in the form of a small disk or film, a new method of ascertaining its dielectric constant (at microwave/mm wave frequencies) using the test sample as a radiator is described. For this purpose the test disk/film backed by a conducting ground plane is appropriately excited by a monopole arrangement. A relevant algorithm depicting the radiation pattern of this assembly is derived. Hence, by measuring the increase in the maximum directive gain due to the inclusion of the dielectric disk/film placed on the ground plane, the dielectric constant of the sample is determined. Test result(s) are compared with those obtained via von Hippel's method.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
