Abstract
AbstractOxygen chemical diffusion in PuO2‐x was investigated in the temperature range of 1473‐1873 K by thermogravimetry as functions of oxygen‐to‐metal (O/M) ratios and temperatures. The oxygen chemical diffusion coefficients, $ \tilde D $ were determined assuming that the reduction curves were dominated by a diffusion process. The O/M ratio and Pu content dependence on the chemical diffusion coefficients were evaluated. The chemical diffusion coefficient had its minimum value at around O/M=1.98 and decreased with increasing Pu content in (U,Pu)O2‐x. The self‐diffusion coefficients were evaluated. A model for describing the relationship among O/M ratio, oxygen chemical diffusion, and self‐diffusion was proposed based on defect chemistry. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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