Measurement of oxide layer thickness on 7050 aluminum alloy surface based on image processing technology

Abstract

This paper presents a method for measuring the thickness of the oxide layer on the surface of 7050 aluminum alloy based on image processing technology. As the 7050 aluminum alloy is oxidized to different degrees at different temperatures and different holding times, its surface color will also change significantly with the degree of oxidation. The image processing method was used to obtain the gray value of the sample photos with different degrees of oxidation, and the surface oxide layer of the sample was subjected to Ar+ layer-by-layer sputter peeling. XPS analysis was performed on the peeled surface to calculate the thickness of the oxide layer. The oxidation was found. Relationship between layer thickness and gray value. The thickness of the oxide layer can be obtained by extracting the gray value of the surface of the test object. This measurement method has the advantages of low cost, non-contact, reliable measurement, convenient and fast.