Abstract
High-resolution observation of a large field of view with a high quality detector is important for single particle analysis or in-situ experiments. Consequently, evaluation of aberrations that depend on position in the field of view, (off-axial aberrations) is required. We report the experimental measurement of off-axial aberrations including higher order components in several optical conditions together with the corresponding off-axial phase maps.
Highlights
We report the experimental measurement of off-axial aberrations including higher order components in several optical conditions together with the corresponding off-axial phase maps
Owing to the development of a high quality cameras with a large number of pixels, high resolution observations in both materials science and life science over a large field of view is becoming important in transmission electron microscopy (TEM)
Measurement of off-axial aberrations including those of higher rank was reported using diffractograms calculated from different positions in a wide field of view
Summary
1ePSIC: Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd, Didcot, Oxford, OX11 0DE, UK 2Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK 3JEOL UK Ltd., Silver Court Watchmead Welwyn Garden City, Herts.,AL7 1LT, UK
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