Abstract
A reversal 4f coherent imaging system with phase objects is presented to measure nonlinear refraction of the materials. The modified system can increase the sensitivity compared with the conventional nonlinear-imaging technique with phase objects. The sensitivity enhancement of the modified system is about two times greater than the conventional technique within 0 ≤ Δφ NL ≤ 1. CS 2 is used to demonstrate the measurement using the reversal 4f coherent imaging system with phase objects.
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