Abstract
We present a method for measuring the modulation transfer function (MTF) of a charge-coupled device (CCD) using frequency- variable sine grating patterns. Compared with other methods, the advantages of our method include a target with continuously variable spatial frequencies, simple data processing and the straightforward projection of the sine pattern to the measured CCD array without an optical system. Measured MTF results for the typical linear and area CCDs within the range of zero to the cutoff spatial frequency are shown.
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