Measurement of localized surface plasmon resonance of metallic nanostructures

Abstract

The measuring technique for characteristics of localized surface plasmon resonance (LSPR) effect of metallic nanostructures is studied in this paper. A simple apparatus for measuring the LSPR properties is designed and developed with the help of an integrating sphere using a single light beam; the sphere inner wall is coated with Teflon and has three ports used for sample, detector and incident light input. By changing the angle and position of the integrating sphere and the sample in the light path, the forward, backward and scattering spectroscopy of the metallic nanostructures can be obtained indicating that the absorption and scattering properties associated with the LSPR effect can be distinguished. It is founded that no matter what measurement form, the spectrum can reflect the general LSPR property, despite there is difference in the spectral intensity and peak. The measuring technique present in this paper may be an alternative way for the characterization of the LSPR effect.