Abstract
A new method has been developed to determine K shell fluorescence cross section and K shell fluorescence yields. This method is based on simultaneous measurement of fluorescence radiation and scattered radiation, thus avoiding problems with measuring the source strength and source-to-detector solid angle. The K shell fluorescence cross section and K shell fluorescence yield for 21 elements in the atomic range 22≤Z≤64 have been measured by using a Si(Li) detector. The obtained results are compared with the other experimental, theoretical and fit values.
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