Abstract

The paper discusses methods and techniques for measuring the intrinsic S-parameters of external electronic components in strip transmission lines using a P4226 network analyzer. The fundamental difference of the proposed solution consists in the use of a single calibration standard in the form of a shielded electrically long strip transmission line, thereby eliminating the error due to the repeatability of detachable connections of coaxial-strip junctions. R1-162 — high frequency thin film chip-resistors and CC Series — wirewound ceramic chip-inductors were used as the objects of measurement. Extraction of the intrinsic parameters of electronic components is achieved by complete excluding the surrounding circuits from the measurement results.

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