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Abstract
This paper presents a new technique for the measurement of integrated circuit (IC) conducted emissions. In particular, the spectrum of interfering current flowing through an IC port is detected by using a transverse electromagnetic mode (TEM) cell. A structure composed of a microstrip line inserted in a matched TEM cell is considered. The structure is excited by an interfering source connected to one end of the transmission line. The relationship between the current spectrum of the source and the spectrum of the RF power delivered to the TEM mode of the cell is derived. This relationship is evaluated for one specific structure and the experimental validation is shown. Results of conducted emission measurement performed by using such a technique are shown as well and compared with those derived by using the magnetic probe method.
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