Measurement of Infrared Spectral Directional Hemispherical Reflectance and Emissivity at BNM-LNE

Abstract

An infrared reflectometer has been designed by BNM-LNE (Bureau National de Metrologie–Laboratoire National d’Essais) to measure the spectral directional hemispherical reflectance of solid materials at ambient temperature. For opaque materials, the spectral directional emissivity can be calculated from the measured reflectance. The reflectance can be measured from 0.8 to 14 μm in five directions with an angle of 12°, 24°, 36°, 48°, and 60° with respect to the normal to the surface of the sample. The optical arrangement to collect the reflected flux is based on the Coblentz arrangement (hemispherical mirror). In fact, four mirrors cut in an hemisphere are used to collect the flux reflected by the sample. This optical arrangement was chosen to limit the angle of incidence of rays on the detector (38° instead of 90° for the Coblentz arrangement). The final expanded uncertainty (level of confidence 95%) of the reflectance is estimated to be about ±0.03 for wavelengths between 0.8 and 10 μm and ±0.04 for wavelengths over 10 μm. The values of the spectral reflectance measured on a black paint and on a white ceramic tile are compared to those measured by the two laboratories PTB (Physikalisch Technische Bundesanstalt) and NIST (National Institute of Standards and Technology). The results validate the measurements performed at BNM-LNE.