Abstract
Time-resolved ellipsometric measurements were made upon Au, Cu, Ag, Ni, Pd, Ti, Zr, and Hf thin films. Using an elliptically polarized pump beam, the decay of the optically induced polarization of the sample was observed. Characteristic relaxation times are extracted and interpreted in terms of scattering of linear and angular momentum of hot electrons. A systematic variation is observed between different metals that reflects their underlying band structure.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
