Abstract
We present a new in-situ method for direct measurements of the electron loss rate in arbitrary gas mixtures. A homodyne microwave scattering detection technique is used to measure the dynamics of weakly ionized plasma induced via resonant multi-photon ionization of trace amounts of nitric oxide seeded into the gas. This remote, non-intrusive method allows studying of the electron loss mechanisms with nanosecond accuracy. Using this approach, the attachment rate for electrons to molecular oxygen in room temperature, atmospheric pressure air is determined. The measured recombination and attachment rates are in very good agreement with predictions based on literature data.
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