Measurement of effective atomic number of composite materials using scattering of γ-rays

Abstract

In the present experiment, to determine the effective atomic number of composite materials, the scattering of 145 keV γ-rays is studied using a high-resolution HPGe semiconductor detector placed at 70° to the incident beam. The experiment is performed on various elements of different atomic number, 6⩽ Z⩽64, for 145 keV incident photons. The intensity ratio of Rayleigh to Compton scattered peaks, corrected for photo-peak efficiency of the γ-detector and absorption of photons in the target and air, is plotted as a function of atomic number and constituted a fit curve. From this fit curve, the respective effective atomic numbers of the composite materials are determined. The agreement of measured values of effective atomic number with the theory is found to be quite satisfactory.