Abstract

Determining the amount of a hydrogen isotope in a material by elastic recoil spectroscopy (ERS) is a routine capability of many laboratories and the data are relatively easy to analyze when only one isotope of hydrogen is present. However, when two or more isotopes of hydrogen are present the analysis is much more complicated. This paper presents data from such samples including a relatively thick sample of erbium hydride with an approximately 2:1 ratio of protium to deuterium and a sample of silicon with ion implanted deuterium that had absorbed hydrogen on the surface. The usual technique of simulation of the data is employed to determine the hydrogen isotope concentration profiles. This is complemented by taking data from the samples at various incident alpha particle beam energies to determine the identity of individual isotopes. This enables use of the variation in stopping power and cross-section with energy to cause, for example, a buried layer of deuterium to be removed from the position in the spectrum where protium from the surface of the sample will overlap the deuterium spectrum.

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