Measurement of complex terahertz dielectric properties of polymers using an improved free-space technique

Abstract

The complex dielectric properties of non-polar solid polymer materials were measured in the terahertz (THz) band by a free-space technique employing a frequency-extended vector network analyzer (VNA), and by THz time-domain spectroscopy (TDS). Mindful of THz wave’s unique characteristics, the free-space method for measurement of material dielectric properties in the microwave band was expanded and improved for application in the THz frequency region. To ascertain the soundness and utility of the proposed method, measurements of the complex dielectric properties of a variety of polymers were carried out, including polytetrafluoroethylene (PTFE, known also by the brand name Teflon), polypropylene (PP), polyethylene (PE), and glass fiber resin (Composite Stone). The free-space method relies on the determination of electromagnetic scattering parameters (S-parameters) of the sample, with the gated-reflect-line (GRL) calibration technique commonly employed using a VNA. Subsequently, based on the S-parameters, the dielectric constant and loss characteristic of the sample were calculated by using a Newtonian iterative algorithm. To verify the calculated results, THz TDS technique, which produced Fresnel parameters such as reflection and transmission coefficients, was also used to independently determine the dielectric properties of these polymer samples, with results satisfactorily corroborating those obtained by the free-space extended microwave technique.