Abstract
A method for measuring the microwave properties of bulk and film ferroelectric materials has been developed, using a waveguide partially filled by a sample of the material to be studied. Depending on sensitivity, either reflection in a shorted waveguide or transmission in a 2-port system can be investigated. The complex reflection coefficient, S11(f) frequency dependence or transmission coefficient S21(f) were measured by scanning with a vector network analyzer. The studied films were deposited onto dielectric substrates, and a film-on-substrate sandwich was arranged along the waveguide. Complex computer analysis was carried out on the experimental results to verify the theoretical calculations.
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