Measurement of anomalous scattering factors of tin using characteristic X-ray photons

Abstract

The imaginary and real parts of anomalous scattering factors of Sn atoms around the K shell binding energy are measured using K and L X-ray photons. Gamma photons of energy 59.54 keV from an Am-241 radioactive source are used to excite K and L X-ray photons of various energies. By measuring the intensities of incident and transmitted X-ray photons in Sn foil with a good geometry arrangement, the K shell photoelectric cross sections are determined around the K shell binding energy of Sn. The real and imaginary parts of anomalous scattering factors of Sn are determined from K shell photoelectric cross section values. Experimentally determined form factors are compared with the theoretical prediction and experimental data obtained with synchrotron source.