Abstract
Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic Al x Ga 1-x N epitaxial layers with 0 ≤ x ≤ 1.0 throughout the visible wavelength region 457 nm < λ < 800 nm. The dispersion, measured by a prism coupling waveguide technique is found to be well described by a first-order Sellmeier dispersion formula parameterized as functions of x and λ.
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