Abstract
A convolution procedure is described for the determination of 18O diffusion profiles from data taken using the nuclear reaction 18O(p, α)15N. A Van de Graaff generator is used as a source of protons.Three types of concentration profile for the reacting species are considered: a step function, an error function and a thin-film-diffusion function. These are convoluted with functions that represent the spread and straggling of the proton beam, and the shape of the resonance capture cross section. The fit with the measured curve of resonant alpha yield against proton energy is estimated by a x2 analysis. The concentration profile parameters are varied so as to minimize x2.The analysis has proved successful in measuring oxide thicknesses on chromium and oxygen diffusion profiles in TiO2 and Cr2O3, and sample experiments are described.
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