Measurement of 12Cq+ and 35Clq+ ion induced X-ray production cross sections in V, Zr and Sn metal oxide films at 0.1 MeV/u - 1.0 MeV/u energies

Abstract

Experimental X-ray production cross sections in matter are key to fundamental ion-atom interaction studies. They also find practical applications such as in the advancement of ion beam materials analysis techniques like Particle Induced X-ray Emission (PIXE) spectroscopy. Experimental work shows that heavy ion probes induce higher X-ray yields in target atoms compared to light ions of the same velocity. This, in principle, implies higher sensitivity for PIXE analyses performed using heavy ions (Heavy Ion PIXE). There is therefore need for substantial experimental data to improve existing theoretical models that describe X-ray production due to heavy ion-atom collisions. This article presents measurements carried out to determine K-shell X-ray production cross sections in vanadium (V) due to 12Cq+ ions, and L-shell X-ray production cross sections in zirconium (Zr) and tin (Sn) due to 12Cq+ (q = 2, 3) and 35Clq+ (q = 3, 5, 6, 7) MeV ion beams within a velocity range of 0.1 MeV/u - 1.0 MeV/u. Measured cross sections are compared with predictions by the modified Plane Wave Born Approximation (PWBA) and the ECPSSR theory. Observed agreements and discrepancies between experiment and theory are discussed in terms of the underlying ionisation mechanisms.