Abstract
The principles and applications of scanning electron microscopy (SEM) to electrochemical power sources are explained. The general features of an SEM are briefly described with particular attention to (1) generation and focusing of the electron beam over the samples, (2) interactions between electrons and atoms in the sample producing the analytical signals, (3) detection and recording modes, and (4) image reconstruction from secondary or backscattered electrons. Electron probe microanalysis (EPMA), using wavelength-dispersive or energy-dispersive detectors for X-ray spectrometry (wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS)), is introduced to illustrate the potential of this technique for qualitative and quantitative elemental chemical analysis. Finally, applications of SEM and EPMA in the field of electrochemical storage devices are introduced, with emphasis on morphology, granulometry, and composition of electrodes.
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