Abstract
ABSTRACT We have proposed two methods for measuring liquid crystal response times using a microwave resonance method and an optical transmitted light measurement method. In this paper, the response time characteristics for the paralleled nematic and twisted nematic liquid crystal layer structures were investigated by using two different proposed measurement methods. The results obtained with these two different methods can be compared quantitatively by clarifying the physical meaning of the response time of each method. Also the transition performance of response time for the microstrip-line type liquid crystal devices was measured by using the proposed microwave resonance method.
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