Abstract

As a switching element for active-matrix flat panel display, carrier mobility, current on-off ratio, threshold voltage and stability of thin film transistors (TFTs) are key indicators that determine the the performance of AM display device. On a constructed PXIe bus based TFT measurement platform, general instrument modules trigger each other interactively via PXIe backplane trigger bus, realizing high-precision automatic measurement of parameters of TFT devices. This paper introduces the design process and methods of realizing the functions of software necessary for this system so as to realize automatic testing of the output and transfer characteristics of TFT devices, and also the graphic display, data analysis and parameter calculation on the basis of measurement result. The verification result indicates that this system is structurally impact and highly precise, compatible and stable. This enables it to measure the electrical characteristics of TFTs automatically and effectively.

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