Abstract
This paper presents a measurement-based stability analysis of commercially available single-phase inverters in public low-voltage networks. In practice, manufacturers typically do not disclose the parameters of the inverter design, although interactions with the low-voltage network need to be assessed and predicted. State-of-the-art modeling methods require knowledge about the internal parameters. The method proposed in the paper is based on measurements in the laboratory and does not require detailed knowledge about the specific inverter design for the identification of the black-box linear time-periodic representation. The gained information is used for the black-box stability analysis in the frequency range up to 2 kHz, which covers the bandwidth of the control of the inverters. The method is validated for a commercially available photovoltaic inverter in the laboratory. An instability that leads to a shutdown of the inverter is demonstrated, while the critical frequency range is predicted accurately.
Highlights
The aim of higher efficiency in the energy sector, especially with respect to electric loads and generators, has led to an increase in power electronic (PE) devices in public electricity networks (e.g., [1])
Such studies can only be performed if the detailed representation of the device under test (DUT) is known, which are usually conducted by respective device manufacturers only
The aim of this paper is to propose and validate a fully measurement-based black-box stability analysis for single-phase commercially available inverters taking the uncertainty of network impedances into account
Summary
The aim of higher efficiency in the energy sector, especially with respect to electric loads and generators, has led to an increase in power electronic (PE) devices in public electricity networks (e.g., [1]). These PE devices are typically converters (AC/AC power conversion), inverters (DC/AC power conversion), and rectifiers (AC/DC power conversion) and are referred to as devices in this article. Most studies were derived from white-box models Such studies can only be performed if the detailed representation of the device under test (DUT) is known, which are usually conducted by respective device manufacturers only.
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