Abstract
This paper presents a new frustum ray tracing technique (FRTT) for the prediction of channel characteristic maps in a complex in-building environment. FRTT utilizes a fast line-clipping algorithm and does not rely on the conventional time-consuming ray intersection tests. Dielectric properties of building materials are empirically derived from in situ transmission coefficient measurements, which have enhanced the accuracy of prediction results. The FRTT is found to be more accurate and computationally efficient than the conventional ray tracing technique for area-type predictions. A detailed comparison has been made using measured narrow-band and wide-band channel characteristic maps with high spatial resolution (0.2 wavelength) at line-of-sight (LOS), non-LOS, and a corner transition region inside a multifloored building. The agreement between FRTT prediction and measurement appears to be excellent.
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