Abstract
This review focuses upon the measurement of force, indentation, and deformation with theatomic force microscope (AFM). Measurement and theory for elastic and viscoelasticparticles and substrates are covered, as well as for deformable fluid drops and bubbles. Abrief review is given of papers that use tapping mode imaging, normal and lateral forcemodulation, noise spectra, and indentation measurements. Measurement andcalibration techniques that are essential for quantitative results with the AFM arediscussed in detail. The author’s contribution to elastic and viscoelastic theory forextended range forces is outlined, and the application of these to measured data forthe adhesive van der Waals force and for the electric double layer repulsion isdescribed.
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