Abstract
A method and an installation for evaluation the profile of distribution of recombination coefficients and current density over the area of light-emitting heterostructures at low injection levels based on local values of the 3 dB frequency are described. Using the example of measuring the parameters of commercial blue InGaN/GaN-based LEDs, it is shown that the current density is higher in those areas of the chip where the 3 dB frequency is lower.
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